Description
Module Type:High-Speed Digital I/O Module
Model Number:PXIe-6570/PXIe-6571
Brand:National Instruments
Compatibility:Compatible with PXI Express chassis
Digital Channels:64 channels (PXIe-6570), 128 channels (PXIe-6571)
Maximum Data Rate:Up to 100 MHz per channel
Resolution:8-bit resolution
Voltage Range:±12 V
Connectors:High-density LEMO connectors
Operating Temperature Range:-40°C to +85°C
The PXIe-6570 and PXIe-6571 high-speed digital I/O modules are built to meet the demands of modern test and measurement applications.
With up to 200 MS/s per channel sampling rate, these modules provide unparalleled speed and accuracy for high-frequency digital signal analysis.
The differential and single-ended channel options offer flexibility for various test setups, while the rugged design ensures reliable operation across extreme temperature ranges.
The 80-pin HSDIO connector guarantees robust connectivity and signal integrity.
Ideal for use in automotive, aerospace, and telecommunications sectors, these modules support high-throughput data acquisition and stimulus generation, making them a valuable addition to any test engineer’s toolkit.
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